APSCA Meeting 84 Smart Card Product Testing & Certification Seminar Home Info Desk Global Interoperability through the Type Approval process - Dan Lee ( dan.lee@jcbati.com ) Overview of domestic POS device requirements in China(Chinese) - Fan GuiFu ( fan@bctest.com ) Acquirer Device Validation Testing (ADVT) Explained - Zhang Wen Xiang ( wezhang@visa.com ) J/Smart Implementation Test (JIT) - Takuma Muroi ( takuma.muroi@jcb.co.jp ) Optimise your internal testing for smooth EMV migration - Lars Villebaek ( lars@technologyagents.net ) Major pitfalls in the end-to-end product approval process - Sadou Zhang ( zhangshd@paxsz.com ) Develop your product in a faster and more efficient way - Rick Yuan Hsu ( rick.hsu@collisasia.com ) Overview of domestic POS device requirements in China(English) - Fan GuiFu ( fan@bctest.com )